IDT70V5388S166BGI【PDF 28/29 页】IC SRAM 1.125MBIT 166MHZ 272BGA

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IDT70V5388/78

3.3V 64/32K x 18 Synchronous FourPort? Static RAM

Identification Register Definitions

Industrial and Commercial Temperature Ranges

0x31D

Instruction Field

Revision Number (31:28)

IDT Device ID (27:12)

IDT JEDEC ID (11:1)

ID Register Indicator Bit (Bit 0)

NOTE:

1. Device ID for IDT70V5378 is 0x31E.

Scan Register Sizes

Register Name

Instruction (IR)

MBIST Mode Select Register (MSR)

Bypass (BYR)

Identification (IDR)

Boundary Scan (BSR)

MBIST Result (MRR)

Value

0x0

(1)

0x33

1

Bit Size

4

2

1

32

392 Note (3)

26

Description

Reserved for version number

Defines IDT part number

Allows unique identification of device vendor as IDT

Indicates the presence of an ID register

5649 tbl 15

System Interface Parameters

5649 tbl 16

Instruction

EXTEST

BYPASS

IDCODE

HIGHZ

SAMPLE/PRELOAD

MBIST_MODE_SELECT

RUNBIST

INT_SCAN

CLAMP

RESERVED

PRIVATE

Code

0000

1111

0111

0110

0001

1010

1000

0100

0101

0010, 0011

1001, 1011, 1100, 1101, 1110

Description

Forces contents of the boundary scan cells onto the device outputs (1) .

Places the boundary scan register (BSR) between TDI and TDO.

Places the b ypass register (BYR) between TDI and TDO.

Loads the ID register (IDR) with the vendor ID code and places the

register between TDI and TDO.

Places the bypass register (BYR) b etween TDI and TDO. Forces all

device output drivers to a High-Z state.

Places the boundary scan register (BSR) between TDI and TDO.

SAMPLE allows data from device inputs (2) to be captured in the

boundary scan cells and shifted serially through TDO. PRELOAD allows

data to be input serially into the boundary scan cells via the TDI.

Places the MBIST Mode Register between TDI and TDO. A value of '00'

written into this register will allow MBIST to run in standard memory test

mode, outputting valid results as appropriate via the MBIST Result

Register. A value of '11' written into the MBIST Mode Register will force

the MBIST Result Register (MRR) to report a result of 'FAIL'., with 8E0000

failed read cycles noted (i.e., the MRR content = (8E0000h, 0, x). The

value of the MBIST Mode Register is no t guaranteed at power-up and is

not affected b y Master reset and JTAG reset.

Invokes MBIST. Internally updates MBIST result register with Go-NoGo

information and number of issues. PROGRAM_MBIST_MODE_REGISTER

must be run prior to executing RUNBIST in order to ensure valid results.

There is no need to repeat this instructio n unless the mode of operation

is changed: the MMR will re tain its programmed value until overwritten or

the device is powered down.

Scans out partial information. Places MBIST result register (MRR)

between TDI & TDO.

Uses BYR. Forces contents of the boundary scan cells onto the device

outputs. Places the Bypass reg ister (BYR) between TDI & TDO.

Several combinations are reserved. Do not use codes other than those

identified above.

Several combinations arePRIVATE (for IDT internal use). Do not use

codes other than those identified above.

5649 tbl 17

NOTES:

1. Device outputs = All device outputs except TDO.

2. Device inputs = All device inputs except TDI, TMS, and TRST .

3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local

IDT sales representative.

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